Research Fellow

Jungseok Chae

Jungseok Chae is an expert on nanoscale spectroscopies characterizing materials and devices. He studied edge current on graphene devices using scanning gate microscopy and many body physics in graphene using scanning tunneling spectroscopy. He characterized photovoltaic and plasmonic materials at nanoscale using optical spectroscopy combined with atomic force microscope. He also applied a new concept of nano-fabricated force sensors for nanoscale optical spectroscopy enabling increased force sensitivity and real time measurement. As a research fellow at Center for Quantum Nanoscience (QNS) of the Institute for Basic Science (IBS), his research interests focus on the magnetic instability measurement of single atoms and molecules using spin-polarized atomic force microscopy and the charge relaxation time of single defects on semiconductors using optics combined scanning tunneling microscopy.
“Be confident with what you achieved.”

- Young Kuk

2010
PhD in Physics, Seoul National University, Korea
2004
MS in Physics, Seoul National University, Korea
2002
BS in Physics, Seoul National University, Korea
2017 - Current
Research Fellow of Center for Quantum Nanoscience (QNS) of Institute of Basic Science (IBS)
2013 - 2016
Postdoctoral Research Associate at NIST, USA
2010 - 2013
Postdoctoral Research Associate at NIST, USA
Lee Minjun, Oh Myungchul et al., Surface Science 2019
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Sungmin Kim, Sun Ouk Yi et al., Journal of Physics: Condensed Matter 2018
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