Affiliation: Zurich Instruments AG

Talk: August 9, 2019

Research Field: Scanning Probe Microsopy, Digital Signal Processing

Smart versus Big Data in SPM: from frequency to time domain analysis

Non-linearity or transient phenomena in Scanning Probe Microscopy (SPM) tip-sample interaction are responsible for large deviations in simple harmonic oscillator models that necessitate various multifrequency techniques or timeresolved analysis. By now, many different methods of data deconvolution have been used, some of which may be platform dependent to a single SPM manufacturer. In this talk, I would like to focus on smart and universal data acquisition using FPGA-based hardware and server-based software, which can work with any third-party instruments. Both time and frequency domain analysis can then be performed in realtime or streamed to a usable data set for further calculation. The aim is to either crunch down data to its essential components using lock-in techniques in open or closed loops or to accurately align large digitized data streams in a useable matrix format [1]. The ability to bring Arbitrary Waveform Generator (AWG) in the SPM path allows for precise control of delays for either pure electrical pump-probe approach or in combination with optical methods [2]. Extension of this to the manipulation of qubit state will also be addressed.

References:

[1] Ehsan Nasr Esfahani, PhD dissertation, University of Washington, Seatle, 2018
[2] Time-resolved SPM